Power Device Analysis Option for HDO4000

• Option specific to the HDO4000 Series oscilloscopes (sold separately)
• Software only; other devices are required for operation depending on requirements
• See manual linked on this webpage for hardware recommendations
• Turn on/off delays
• Switching power/energy losses
• Conduction losses
• Reverse recovery analysis
• Double/Multi pulse test analysis
• Help markers to highlight limits

Power Device Software Option for HDO4000
The Power-Device software option for Teledyne LeCroy Oscilloscopes is designed to enable you to easily make power measurements of GaN and SiC devices in conformance with JEDEC standards. The software is extremely useful when testing semiconductor devices (such as MOSFETs) using the double pulse test (DPT) method.

Complete Solution for DPT
Double Pulse Test (DPT) for characterizing silicon carbide (SiC) and gallium nitride (GaN) devices is easier with Teledyne LeCroy’s Power-Device software, 12-bit high-definition oscilloscopes, and comprehensive probe offerings.
*Image shows sample setup using this software option. Items show in image are sold separately.

Easy Setup and Configuration
Define your input signals once and allow Power-Device to display measurement results in an easy to read, interactive table with the ability to track measurements. Enhanced convenience means you can fine tune any horizontal or vertical skews between signals from within the software itself.

Flexible and Efficient
Simply select a test and make measurements by automatically setting limits recommended by JEDEC guidelines or set any of the measurement limits manually. View all test results in the Numerics window with a simple push of a button.